Investigation of polysilicon passivated contact's resilience to potential-induced degradation

• Main Authors: LUO WEI, CHEN NING, KE CANGMING, WANG YAN, ABERLE,ARMIN GERHARD, SEERAM RAMAKRISHNA, SHUBHAM DUTTAGUPTA, KHOO YONG SHENG
• Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
• Format: Article
• Language: English
• Published: ELSEVIER SCIENCE BV 2020
• Subjects: Science & Technology; Technology; Physical Sciences; Energy & Fuels; Materials Science, Multidisciplinary; Physics, Applied; Materials Science; Physics; PV module reliability; Potential-induced degradation (PID); Polysilicon-based passivated contact; Surface polarization effect; PID recovery; PID solution; SILICON SOLAR-CELLS; PHOTOVOLTAIC MODULES; EXPLANATION; EMITTER
• Online Access: https://scholarbank.nus.edu.sg/handle/10635/176841
• Institution: National University of Singapore

10.1016/j.solmat.2019.02.038