Investigation of the Impact of Illumination on the Polarization-Type Potential-Induced Degradation of Crystalline Silicon Photovoltaic Modules

• Main Authors: LUO WEI, Hacke, Peter, Hsian, Saw Min, WANG YAN, ABERLE,ARMIN GERHARD, SEERAM RAMAKRISHNA, KHOO YONG SHENG
• Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
• Format: Article
• Language: English
• Published: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC 2020
• Subjects: Science & Technology; Technology; Physical Sciences; Energy & Fuels; Materials Science, Multidisciplinary; Physics, Applied; Materials Science; Physics; Crystalline silicon solar cells; n-passivated emitter rear totally diffused (PERT) bifacial solar cells; photovoltaic (PV) module reliability; potential-induced degradation (PID); p-type bifacial PERC solar cells; surface polarization; SI SOLAR-CELLS; CURRENT-DENSITY; VOLTAGE; EXPLANATION; TEMPERATURE; MICROSCOPY; EMITTER; TESTS
• Online Access: https://scholarbank.nus.edu.sg/handle/10635/176843
• Institution: National University of Singapore

10.1109/JPHOTOV.2018.2843791