Investigation of Potential-Induced Degradation in n-PERT Bifacial Silicon Photovoltaic Modules with a Glass/Glass Structure

10.1109/JPHOTOV.2017.2762587

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Main Authors:	LUO WEI, KHOO YONG SHENG, JAI PRAKASH, JOHNSON KAI CHI WONG, WANG YAN, ABERLE,ARMIN GERHARD, SEERAM RAMAKRISHNA
Other Authors:	DEPT OF ELECTRICAL & COMPUTER ENGG
Format:	Article
Language:	English
Published:	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC 2020
Subjects:	Science & Technology Technology Physical Sciences Energy & Fuels Materials Science, Multidisciplinary Physics, Applied Materials Science Physics Encapsulation materials glass/glass modules n-type passivated emitter rear totally diffused (n-PERT) bifacial silicon solar cells potential-induced degradation (PID) photovoltaic (PV) module reliability STACKING-FAULTS SOLAR-CELLS EXPLANATION VOLTAGE FRONT
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/176844
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Institution:	National University of Singapore
Language:	English

id	sg-nus-scholar.10635-176844
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spelling	sg-nus-scholar.10635-1768442024-04-04T02:34:07Z Investigation of Potential-Induced Degradation in n-PERT Bifacial Silicon Photovoltaic Modules with a Glass/Glass Structure LUO WEI KHOO YONG SHENG JAI PRAKASH JOHNSON KAI CHI WONG WANG YAN ABERLE,ARMIN GERHARD SEERAM RAMAKRISHNA DEPT OF ELECTRICAL & COMPUTER ENGG MECHANICAL ENGINEERING SOLAR ENERGY RESEARCH INST OF S'PORE Science & Technology Technology Physical Sciences Energy & Fuels Materials Science, Multidisciplinary Physics, Applied Materials Science Physics Encapsulation materials glass/glass modules n-type passivated emitter rear totally diffused (n-PERT) bifacial silicon solar cells potential-induced degradation (PID) photovoltaic (PV) module reliability STACKING-FAULTS SOLAR-CELLS EXPLANATION VOLTAGE FRONT 10.1109/JPHOTOV.2017.2762587 IEEE JOURNAL OF PHOTOVOLTAICS 8 1 16-22 2020-09-29T02:57:29Z 2020-09-29T02:57:29Z 2018-01-01 2020-09-28T14:27:45Z Article LUO WEI, KHOO YONG SHENG, JAI PRAKASH, JOHNSON KAI CHI WONG, WANG YAN, ABERLE,ARMIN GERHARD, SEERAM RAMAKRISHNA (2018-01-01). Investigation of Potential-Induced Degradation in n-PERT Bifacial Silicon Photovoltaic Modules with a Glass/Glass Structure. IEEE JOURNAL OF PHOTOVOLTAICS 8 (1) : 16-22. ScholarBank@NUS Repository. https://doi.org/10.1109/JPHOTOV.2017.2762587 2156-3381 2156-3403 https://scholarbank.nus.edu.sg/handle/10635/176844 en IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC Elements
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
language	English
topic	Science & Technology Technology Physical Sciences Energy & Fuels Materials Science, Multidisciplinary Physics, Applied Materials Science Physics Encapsulation materials glass/glass modules n-type passivated emitter rear totally diffused (n-PERT) bifacial silicon solar cells potential-induced degradation (PID) photovoltaic (PV) module reliability STACKING-FAULTS SOLAR-CELLS EXPLANATION VOLTAGE FRONT
spellingShingle	Science & Technology Technology Physical Sciences Energy & Fuels Materials Science, Multidisciplinary Physics, Applied Materials Science Physics Encapsulation materials glass/glass modules n-type passivated emitter rear totally diffused (n-PERT) bifacial silicon solar cells potential-induced degradation (PID) photovoltaic (PV) module reliability STACKING-FAULTS SOLAR-CELLS EXPLANATION VOLTAGE FRONT LUO WEI KHOO YONG SHENG JAI PRAKASH JOHNSON KAI CHI WONG WANG YAN ABERLE,ARMIN GERHARD SEERAM RAMAKRISHNA Investigation of Potential-Induced Degradation in n-PERT Bifacial Silicon Photovoltaic Modules with a Glass/Glass Structure
description	10.1109/JPHOTOV.2017.2762587
author2	DEPT OF ELECTRICAL & COMPUTER ENGG
author_facet	DEPT OF ELECTRICAL & COMPUTER ENGG LUO WEI KHOO YONG SHENG JAI PRAKASH JOHNSON KAI CHI WONG WANG YAN ABERLE,ARMIN GERHARD SEERAM RAMAKRISHNA
format	Article
author	LUO WEI KHOO YONG SHENG JAI PRAKASH JOHNSON KAI CHI WONG WANG YAN ABERLE,ARMIN GERHARD SEERAM RAMAKRISHNA
author_sort	LUO WEI
title	Investigation of Potential-Induced Degradation in n-PERT Bifacial Silicon Photovoltaic Modules with a Glass/Glass Structure
title_short	Investigation of Potential-Induced Degradation in n-PERT Bifacial Silicon Photovoltaic Modules with a Glass/Glass Structure
title_full	Investigation of Potential-Induced Degradation in n-PERT Bifacial Silicon Photovoltaic Modules with a Glass/Glass Structure
title_fullStr	Investigation of Potential-Induced Degradation in n-PERT Bifacial Silicon Photovoltaic Modules with a Glass/Glass Structure
title_full_unstemmed	Investigation of Potential-Induced Degradation in n-PERT Bifacial Silicon Photovoltaic Modules with a Glass/Glass Structure
title_sort	investigation of potential-induced degradation in n-pert bifacial silicon photovoltaic modules with a glass/glass structure
publisher	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
publishDate	2020
url	https://scholarbank.nus.edu.sg/handle/10635/176844
_version_	1800914427369750528

Investigation of Potential-Induced Degradation in n-PERT Bifacial Silicon Photovoltaic Modules with a Glass/Glass Structure

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