Investigation of Potential-Induced Degradation in n-PERT Bifacial Silicon Photovoltaic Modules with a Glass/Glass Structure

• Main Authors: LUO WEI, KHOO YONG SHENG, JAI PRAKASH, JOHNSON KAI CHI WONG, WANG YAN, ABERLE,ARMIN GERHARD, SEERAM RAMAKRISHNA
• Other Authors: DEPT OF ELECTRICAL & COMPUTER ENGG
• Format: Article
• Language: English
• Published: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC 2020
• Subjects: Science & Technology; Technology; Physical Sciences; Energy & Fuels; Materials Science, Multidisciplinary; Physics, Applied; Materials Science; Physics; Encapsulation materials; glass/glass modules; n-type passivated emitter; rear totally diffused (n-PERT) bifacial silicon solar cells; potential-induced degradation (PID); photovoltaic (PV) module reliability; STACKING-FAULTS; SOLAR-CELLS; EXPLANATION; VOLTAGE; FRONT
• Online Access: https://scholarbank.nus.edu.sg/handle/10635/176844
• Institution: National University of Singapore

10.1109/JPHOTOV.2017.2762587