Investigation of Potential-Induced Degradation in n-PERT Bifacial Silicon Photovoltaic Modules with a Glass/Glass Structure

Investigation of Potential-Induced Degradation in n-PERT Bifacial Silicon Photovoltaic Modules with a Glass/Glass Structure

10.1109/JPHOTOV.2017.2762587

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Bibliographic Details
Main Authors: LUO WEI, KHOO YONG SHENG, JAI PRAKASH, JOHNSON KAI CHI WONG, WANG YAN, ABERLE,ARMIN GERHARD, SEERAM RAMAKRISHNA
Other Authors: DEPT OF ELECTRICAL & COMPUTER ENGG
Format: Article
Language:English
Published: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC 2020
Subjects:
Science & Technology
Technology
Physical Sciences
Energy & Fuels
Materials Science, Multidisciplinary
Physics, Applied
Materials Science
Physics
Encapsulation materials
glass/glass modules
n-type passivated emitter
rear totally diffused (n-PERT) bifacial silicon solar cells
potential-induced degradation (PID)
photovoltaic (PV) module reliability
STACKING-FAULTS
SOLAR-CELLS
EXPLANATION
VOLTAGE
FRONT
Online Access:https://scholarbank.nus.edu.sg/handle/10635/176844
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Institution: National University of Singapore
Language: English

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https://scholarbank.nus.edu.sg/handle/10635/176844

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