Conductive Atomic Force Microscope Study of Bipolar and Threshold Resistive Switching in 2D Hexagonal Boron Nitride Films
10.1038/s41598-018-21138-x
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2020
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sg-nus-scholar.10635-1778262024-11-09T18:28:00Z Conductive Atomic Force Microscope Study of Bipolar and Threshold Resistive Switching in 2D Hexagonal Boron Nitride Films Ranjan, A Raghavan, N O'shea, S.J Mei, S Bosman, M Shubhakar, K Pey, K.L MATERIALS SCIENCE AND ENGINEERING 10.1038/s41598-018-21138-x Scientific Reports 8 1 2854 2020-10-20T03:28:30Z 2020-10-20T03:28:30Z 2018 Article Ranjan, A, Raghavan, N, O'shea, S.J, Mei, S, Bosman, M, Shubhakar, K, Pey, K.L (2018). Conductive Atomic Force Microscope Study of Bipolar and Threshold Resistive Switching in 2D Hexagonal Boron Nitride Films. Scientific Reports 8 (1) : 2854. ScholarBank@NUS Repository. https://doi.org/10.1038/s41598-018-21138-x 20452322 https://scholarbank.nus.edu.sg/handle/10635/177826 Attribution 4.0 International http://creativecommons.org/licenses/by/4.0/ Unpaywall 20201031 |
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10.1038/s41598-018-21138-x |
| author2 |
MATERIALS SCIENCE AND ENGINEERING |
| author_facet |
MATERIALS SCIENCE AND ENGINEERING Ranjan, A Raghavan, N O'shea, S.J Mei, S Bosman, M Shubhakar, K Pey, K.L |
| format |
Article |
| author |
Ranjan, A Raghavan, N O'shea, S.J Mei, S Bosman, M Shubhakar, K Pey, K.L |
| spellingShingle |
Ranjan, A Raghavan, N O'shea, S.J Mei, S Bosman, M Shubhakar, K Pey, K.L Conductive Atomic Force Microscope Study of Bipolar and Threshold Resistive Switching in 2D Hexagonal Boron Nitride Films |
| author_sort |
Ranjan, A |
| title |
Conductive Atomic Force Microscope Study of Bipolar and Threshold Resistive Switching in 2D Hexagonal Boron Nitride Films |
| title_short |
Conductive Atomic Force Microscope Study of Bipolar and Threshold Resistive Switching in 2D Hexagonal Boron Nitride Films |
| title_full |
Conductive Atomic Force Microscope Study of Bipolar and Threshold Resistive Switching in 2D Hexagonal Boron Nitride Films |
| title_fullStr |
Conductive Atomic Force Microscope Study of Bipolar and Threshold Resistive Switching in 2D Hexagonal Boron Nitride Films |
| title_full_unstemmed |
Conductive Atomic Force Microscope Study of Bipolar and Threshold Resistive Switching in 2D Hexagonal Boron Nitride Films |
| title_sort |
conductive atomic force microscope study of bipolar and threshold resistive switching in 2d hexagonal boron nitride films |
| publishDate |
2020 |
| url |
https://scholarbank.nus.edu.sg/handle/10635/177826 |
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1821228973658472448 |