Conductive Atomic Force Microscope Study of Bipolar and Threshold Resistive Switching in 2D Hexagonal Boron Nitride Films
10.1038/s41598-018-21138-x
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| Main Authors: | , , , , , , |
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| Other Authors: | |
| Format: | Article |
| Published: |
2020
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| Online Access: | https://scholarbank.nus.edu.sg/handle/10635/177826 |
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| Institution: | National University of Singapore |