HOT-CARRIER CHARACTERIZATION OF TUNGSTEN POLYCIDE GATE AND GRADED-JUNCTION MOS TRANSISTORS

Ph.D

Saved in:

Bibliographic Details
Main Author:	LOU CHOON LEONG
Other Authors:	ELECTRICAL ENGINEERING
Format:	Theses and Dissertations
Published:	2020
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/177859
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore

id	sg-nus-scholar.10635-177859
record_format	dspace
spelling	sg-nus-scholar.10635-1778592020-11-19T13:57:16Z HOT-CARRIER CHARACTERIZATION OF TUNGSTEN POLYCIDE GATE AND GRADED-JUNCTION MOS TRANSISTORS LOU CHOON LEONG ELECTRICAL ENGINEERING CHAN DANIEL SIU HUNG CHIM WAI KIN Ph.D DOCTOR OF PHILOSOPHY 2020-10-20T03:49:44Z 2020-10-20T03:49:44Z 1997 Thesis LOU CHOON LEONG (1997). HOT-CARRIER CHARACTERIZATION OF TUNGSTEN POLYCIDE GATE AND GRADED-JUNCTION MOS TRANSISTORS. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/177859 CCK BATCHLOAD 20201023
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Ph.D
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING LOU CHOON LEONG
format	Theses and Dissertations
author	LOU CHOON LEONG
spellingShingle	LOU CHOON LEONG HOT-CARRIER CHARACTERIZATION OF TUNGSTEN POLYCIDE GATE AND GRADED-JUNCTION MOS TRANSISTORS
author_sort	LOU CHOON LEONG
title	HOT-CARRIER CHARACTERIZATION OF TUNGSTEN POLYCIDE GATE AND GRADED-JUNCTION MOS TRANSISTORS
title_short	HOT-CARRIER CHARACTERIZATION OF TUNGSTEN POLYCIDE GATE AND GRADED-JUNCTION MOS TRANSISTORS
title_full	HOT-CARRIER CHARACTERIZATION OF TUNGSTEN POLYCIDE GATE AND GRADED-JUNCTION MOS TRANSISTORS
title_fullStr	HOT-CARRIER CHARACTERIZATION OF TUNGSTEN POLYCIDE GATE AND GRADED-JUNCTION MOS TRANSISTORS
title_full_unstemmed	HOT-CARRIER CHARACTERIZATION OF TUNGSTEN POLYCIDE GATE AND GRADED-JUNCTION MOS TRANSISTORS
title_sort	hot-carrier characterization of tungsten polycide gate and graded-junction mos transistors
publishDate	2020
url	https://scholarbank.nus.edu.sg/handle/10635/177859
_version_	1686108957340336128

HOT-CARRIER CHARACTERIZATION OF TUNGSTEN POLYCIDE GATE AND GRADED-JUNCTION MOS TRANSISTORS

Similar Items