HOT-CARRIER CHARACTERIZATION OF TUNGSTEN POLYCIDE GATE AND GRADED-JUNCTION MOS TRANSISTORS

Ph.D

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Bibliographic Details
Main Author: LOU CHOON LEONG
Other Authors: ELECTRICAL ENGINEERING
Format: Theses and Dissertations
Published: 2020
Online Access:https://scholarbank.nus.edu.sg/handle/10635/177859
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Institution: National University of Singapore
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