GATE OXIDE INTEGRITY STUDY
Master's
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2020
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Online Access: | https://scholarbank.nus.edu.sg/handle/10635/178965 |
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sg-nus-scholar.10635-1789652020-11-19T13:57:17Z GATE OXIDE INTEGRITY STUDY JOSHUA LEE WAI KHIN ELECTRICAL ENGINEERING CHOI WEE KIONG RAJESH MEHTA Master's MASTER OF ENGINEERING 2020-10-22T05:30:48Z 2020-10-22T05:30:48Z 1999 Thesis JOSHUA LEE WAI KHIN (1999). GATE OXIDE INTEGRITY STUDY. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/178965 CCK BATCHLOAD 20201023 |
institution |
National University of Singapore |
building |
NUS Library |
continent |
Asia |
country |
Singapore Singapore |
content_provider |
NUS Library |
collection |
ScholarBank@NUS |
description |
Master's |
author2 |
ELECTRICAL ENGINEERING |
author_facet |
ELECTRICAL ENGINEERING JOSHUA LEE WAI KHIN |
format |
Theses and Dissertations |
author |
JOSHUA LEE WAI KHIN |
spellingShingle |
JOSHUA LEE WAI KHIN GATE OXIDE INTEGRITY STUDY |
author_sort |
JOSHUA LEE WAI KHIN |
title |
GATE OXIDE INTEGRITY STUDY |
title_short |
GATE OXIDE INTEGRITY STUDY |
title_full |
GATE OXIDE INTEGRITY STUDY |
title_fullStr |
GATE OXIDE INTEGRITY STUDY |
title_full_unstemmed |
GATE OXIDE INTEGRITY STUDY |
title_sort |
gate oxide integrity study |
publishDate |
2020 |
url |
https://scholarbank.nus.edu.sg/handle/10635/178965 |
_version_ |
1686109036443860992 |