DEGRADATION AND ANNEALING OF ELECTRICALLY-STRESSED THIN OXIDE IN MOS DEVICES
Master's
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| Format: | Theses and Dissertations |
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2020
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| Online Access: | https://scholarbank.nus.edu.sg/handle/10635/180009 |
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sg-nus-scholar.10635-1800092020-11-19T13:57:18Z DEGRADATION AND ANNEALING OF ELECTRICALLY-STRESSED THIN OXIDE IN MOS DEVICES NG WEE THONG ELECTRICAL ENGINEERING C.H. LING Master's MASTER OF ENGINEERING 2020-10-26T06:31:53Z 2020-10-26T06:31:53Z 1999 Thesis NG WEE THONG (1999). DEGRADATION AND ANNEALING OF ELECTRICALLY-STRESSED THIN OXIDE IN MOS DEVICES. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/180009 CCK BATCHLOAD 20201023 |
| institution |
National University of Singapore |
| building |
NUS Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NUS Library |
| collection |
ScholarBank@NUS |
| description |
Master's |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING NG WEE THONG |
| format |
Theses and Dissertations |
| author |
NG WEE THONG |
| spellingShingle |
NG WEE THONG DEGRADATION AND ANNEALING OF ELECTRICALLY-STRESSED THIN OXIDE IN MOS DEVICES |
| author_sort |
NG WEE THONG |
| title |
DEGRADATION AND ANNEALING OF ELECTRICALLY-STRESSED THIN OXIDE IN MOS DEVICES |
| title_short |
DEGRADATION AND ANNEALING OF ELECTRICALLY-STRESSED THIN OXIDE IN MOS DEVICES |
| title_full |
DEGRADATION AND ANNEALING OF ELECTRICALLY-STRESSED THIN OXIDE IN MOS DEVICES |
| title_fullStr |
DEGRADATION AND ANNEALING OF ELECTRICALLY-STRESSED THIN OXIDE IN MOS DEVICES |
| title_full_unstemmed |
DEGRADATION AND ANNEALING OF ELECTRICALLY-STRESSED THIN OXIDE IN MOS DEVICES |
| title_sort |
degradation and annealing of electrically-stressed thin oxide in mos devices |
| publishDate |
2020 |
| url |
https://scholarbank.nus.edu.sg/handle/10635/180009 |
| _version_ |
1686109083847884800 |