HOT-CARRIER CHARACTERIZATION OF SUBMICROMETER MOS TRANSISTORS : SUBTHRESHOLD DEGRADATION AND CHANNEL-WIDTH EFFECT

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Bibliographic Details
Main Author:	QIN WEI HAN
Other Authors:	ELECTRICAL ENGINEERING
Format:	Theses and Dissertations
Published:	2020
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/180018
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-180018
record_format	dspace
spelling	sg-nus-scholar.10635-1800182020-11-19T13:57:18Z HOT-CARRIER CHARACTERIZATION OF SUBMICROMETER MOS TRANSISTORS : SUBTHRESHOLD DEGRADATION AND CHANNEL-WIDTH EFFECT QIN WEI HAN ELECTRICAL ENGINEERING DANIEL CHAN SIU HUNG CHIM WAI KIN Master's MASTER OF ENGINEERING 2020-10-26T06:32:10Z 2020-10-26T06:32:10Z 1999 Thesis QIN WEI HAN (1999). HOT-CARRIER CHARACTERIZATION OF SUBMICROMETER MOS TRANSISTORS : SUBTHRESHOLD DEGRADATION AND CHANNEL-WIDTH EFFECT. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/180018 CCK BATCHLOAD 20201023
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Master's
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING QIN WEI HAN
format	Theses and Dissertations
author	QIN WEI HAN
spellingShingle	QIN WEI HAN HOT-CARRIER CHARACTERIZATION OF SUBMICROMETER MOS TRANSISTORS : SUBTHRESHOLD DEGRADATION AND CHANNEL-WIDTH EFFECT
author_sort	QIN WEI HAN
title	HOT-CARRIER CHARACTERIZATION OF SUBMICROMETER MOS TRANSISTORS : SUBTHRESHOLD DEGRADATION AND CHANNEL-WIDTH EFFECT
title_short	HOT-CARRIER CHARACTERIZATION OF SUBMICROMETER MOS TRANSISTORS : SUBTHRESHOLD DEGRADATION AND CHANNEL-WIDTH EFFECT
title_full	HOT-CARRIER CHARACTERIZATION OF SUBMICROMETER MOS TRANSISTORS : SUBTHRESHOLD DEGRADATION AND CHANNEL-WIDTH EFFECT
title_fullStr	HOT-CARRIER CHARACTERIZATION OF SUBMICROMETER MOS TRANSISTORS : SUBTHRESHOLD DEGRADATION AND CHANNEL-WIDTH EFFECT
title_full_unstemmed	HOT-CARRIER CHARACTERIZATION OF SUBMICROMETER MOS TRANSISTORS : SUBTHRESHOLD DEGRADATION AND CHANNEL-WIDTH EFFECT
title_sort	hot-carrier characterization of submicrometer mos transistors : subthreshold degradation and channel-width effect
publishDate	2020
url	https://scholarbank.nus.edu.sg/handle/10635/180018
_version_	1686109085176430592

HOT-CARRIER CHARACTERIZATION OF SUBMICROMETER MOS TRANSISTORS : SUBTHRESHOLD DEGRADATION AND CHANNEL-WIDTH EFFECT

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