HOT-CARRIER CHARACTERIZATION OF SUBMICROMETER MOS TRANSISTORS : SUBTHRESHOLD DEGRADATION AND CHANNEL-WIDTH EFFECT
Master's
Saved in:
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Theses and Dissertations |
| Published: |
2020
|
| Online Access: | https://scholarbank.nus.edu.sg/handle/10635/180018 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | National University of Singapore |