A STUDY OF HOT-CARRIER DEGRADATION IN NITRIDED AND CONVENTIONAL OXIDES

Master's

Saved in:
Bibliographic Details
Main Author: GOO KAH HEONG
Other Authors: ELECTRICAL ENGINEERING
Format: Theses and Dissertations
Published: 2020
Online Access:https://scholarbank.nus.edu.sg/handle/10635/180234
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
id sg-nus-scholar.10635-180234
record_format dspace
spelling sg-nus-scholar.10635-1802342020-11-19T13:57:19Z A STUDY OF HOT-CARRIER DEGRADATION IN NITRIDED AND CONVENTIONAL OXIDES GOO KAH HEONG ELECTRICAL ENGINEERING LING CHUNG HO Master's MASTER OF ENGINEERING 2020-10-26T07:32:08Z 2020-10-26T07:32:08Z 1999 Thesis GOO KAH HEONG (1999). A STUDY OF HOT-CARRIER DEGRADATION IN NITRIDED AND CONVENTIONAL OXIDES. ScholarBank@NUS Repository. https://scholarbank.nus.edu.sg/handle/10635/180234 CCK BATCHLOAD 20201023
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description Master's
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
GOO KAH HEONG
format Theses and Dissertations
author GOO KAH HEONG
spellingShingle GOO KAH HEONG
A STUDY OF HOT-CARRIER DEGRADATION IN NITRIDED AND CONVENTIONAL OXIDES
author_sort GOO KAH HEONG
title A STUDY OF HOT-CARRIER DEGRADATION IN NITRIDED AND CONVENTIONAL OXIDES
title_short A STUDY OF HOT-CARRIER DEGRADATION IN NITRIDED AND CONVENTIONAL OXIDES
title_full A STUDY OF HOT-CARRIER DEGRADATION IN NITRIDED AND CONVENTIONAL OXIDES
title_fullStr A STUDY OF HOT-CARRIER DEGRADATION IN NITRIDED AND CONVENTIONAL OXIDES
title_full_unstemmed A STUDY OF HOT-CARRIER DEGRADATION IN NITRIDED AND CONVENTIONAL OXIDES
title_sort study of hot-carrier degradation in nitrided and conventional oxides
publishDate 2020
url https://scholarbank.nus.edu.sg/handle/10635/180234
_version_ 1686109096948793344