A STUDY OF HOT-CARRIER DEGRADATION IN NITRIDED AND CONVENTIONAL OXIDES

Master's

Saved in:
Bibliographic Details
Main Author: GOO KAH HEONG
Other Authors: ELECTRICAL ENGINEERING
Format: Theses and Dissertations
Published: 2020
Online Access:https://scholarbank.nus.edu.sg/handle/10635/180234
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Similar Items