SECONDARY IONS EMISSION FROM SI(100)
Master's
Saved in:
Main Author: | LOW HENG SIONG |
---|---|
Other Authors: | PHYSICS |
Format: | Theses and Dissertations |
Published: |
2020
|
Online Access: | https://scholarbank.nus.edu.sg/handle/10635/180491 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
An investigation of the Ar+ ion-enhanced reaction of CCl4 on Si(100) by secondary ion mass spectrometry
by: Wee, A.T.S., et al.
Published: (2014) -
Ionization probability of Si+ ion emission from clean Si under Ar+ bombardment
by: Low, M.H.S., et al.
Published: (2014) -
Ripple rotation on ion sputtered Si (100)
by: Qian, H. X., et al.
Published: (2013) -
Secondary ion emission from silicon under 8 keV O2 + and Ar+ ion bombardment
by: Huan, C.H.A., et al.
Published: (2014) -
Tuning the electron affinity and secondary electron emission of diamond (100) surfaces by diels-alder reaction
by: Qi, D., et al.
Published: (2014)