Secondary ion emission from silicon under 8 keV O2 + and Ar+ ion bombardment

10.1016/0042-207X(95)00207-3

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Bibliographic Details
Main Authors: Huan, C.H.A., Wee, A.T.S., Low, H.S.M., Tan, K.L.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/97872
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Institution: National University of Singapore