A surface potential based compact model for two-dimensional field effect transistors with disorders induced transition behaviors

10.1063/1.5040908

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Bibliographic Details
Main Author: THEAN VOON YEW, AARON
Other Authors: ELECTRICAL AND COMPUTER ENGINEERING
Format: Article
Published: AIP 2020
Online Access:https://scholarbank.nus.edu.sg/handle/10635/184180
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Institution: National University of Singapore
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Summary:10.1063/1.5040908