A surface potential based compact model for two-dimensional field effect transistors with disorders induced transition behaviors
10.1063/1.5040908
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sg-nus-scholar.10635-1841802024-04-25T03:31:15Z A surface potential based compact model for two-dimensional field effect transistors with disorders induced transition behaviors THEAN VOON YEW, AARON ELECTRICAL AND COMPUTER ENGINEERING 10.1063/1.5040908 Journal of Applied Physics 124 3 034302-1 - 034302-8 0021-8979 2020-11-27T08:12:37Z 2020-11-27T08:12:37Z 2018 Article THEAN VOON YEW, AARON (2018). A surface potential based compact model for two-dimensional field effect transistors with disorders induced transition behaviors. Journal of Applied Physics 124 (3) : 034302-1 - 034302-8. ScholarBank@NUS Repository. https://doi.org/10.1063/1.5040908 00218979 https://scholarbank.nus.edu.sg/handle/10635/184180 CC0 1.0 Universal http://creativecommons.org/publicdomain/zero/1.0/ AIP |
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10.1063/1.5040908 |
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ELECTRICAL AND COMPUTER ENGINEERING |
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ELECTRICAL AND COMPUTER ENGINEERING THEAN VOON YEW, AARON |
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THEAN VOON YEW, AARON |
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THEAN VOON YEW, AARON A surface potential based compact model for two-dimensional field effect transistors with disorders induced transition behaviors |
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THEAN VOON YEW, AARON |
title |
A surface potential based compact model for two-dimensional field effect transistors with disorders induced transition behaviors |
title_short |
A surface potential based compact model for two-dimensional field effect transistors with disorders induced transition behaviors |
title_full |
A surface potential based compact model for two-dimensional field effect transistors with disorders induced transition behaviors |
title_fullStr |
A surface potential based compact model for two-dimensional field effect transistors with disorders induced transition behaviors |
title_full_unstemmed |
A surface potential based compact model for two-dimensional field effect transistors with disorders induced transition behaviors |
title_sort |
surface potential based compact model for two-dimensional field effect transistors with disorders induced transition behaviors |
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AIP |
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2020 |
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https://scholarbank.nus.edu.sg/handle/10635/184180 |
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1800914050604859392 |