Sub-10nm Ultra-thin ZnO Channel FET with Record-High 561 µA/µm ION at VDS 1V, High µ-84 cm2/V-s and1T-1RRAM Memory Cell Demonstration Memory Implications for Energy-Efficient Deep-Learning Computing
10.1109/VLSITechnologyandCir46769.2022.9830250
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Main Authors: | , , , , , , , , |
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Other Authors: | |
Format: | Conference or Workshop Item |
Language: | English |
Published: |
IEEE
2022
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Online Access: | https://scholarbank.nus.edu.sg/handle/10635/232258 |
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Institution: | National University of Singapore |
Language: | English |
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