An integrated constrained gradient descent (iCGD) protocol to correct scan-positional errors for electron ptychography with high accuracy and precision

10.1016/j.ultramic.2023.113716

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Bibliographic Details
Main Authors:	Ning, S, Xu, W, Loh, L, Lu, Z, Bosman, M, Zhang, F, He, Q
Other Authors:	MATERIALS SCIENCE AND ENGINEERING
Format:	Article
Published:	Elsevier BV 2023
Subjects:	Correcting scan-positional errors Electron ptychography with high accuracy and precision Integrated constrained gradient descent protocol
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/239092
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Institution:	National University of Singapore

Description
Summary:	10.1016/j.ultramic.2023.113716

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