An integrated constrained gradient descent (iCGD) protocol to correct scan-positional errors for electron ptychography with high accuracy and precision

• Main Authors: Ning, S, Xu, W, Loh, L, Lu, Z, Bosman, M, Zhang, F, He, Q
• Other Authors: MATERIALS SCIENCE AND ENGINEERING
• Format: Article
• Published: Elsevier BV 2023
• Subjects: Correcting scan-positional errors; Electron ptychography with high accuracy and precision; Integrated constrained gradient descent protocol
• Online Access: https://scholarbank.nus.edu.sg/handle/10635/239092
• Institution: National University of Singapore

10.1016/j.ultramic.2023.113716