An integrated constrained gradient descent (iCGD) protocol to correct scan-positional errors for electron ptychography with high accuracy and precision

10.1016/j.ultramic.2023.113716

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Bibliographic Details
Main Authors:	Ning, S, Xu, W, Loh, L, Lu, Z, Bosman, M, Zhang, F, He, Q
Other Authors:	MATERIALS SCIENCE AND ENGINEERING
Format:	Article
Published:	Elsevier BV 2023
Subjects:	Correcting scan-positional errors Electron ptychography with high accuracy and precision Integrated constrained gradient descent protocol
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/239092
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-239092
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spelling	sg-nus-scholar.10635-2390922024-04-17T02:42:56Z An integrated constrained gradient descent (iCGD) protocol to correct scan-positional errors for electron ptychography with high accuracy and precision Ning, S Xu, W Loh, L Lu, Z Bosman, M Zhang, F He, Q MATERIALS SCIENCE AND ENGINEERING PHYSICS Correcting scan-positional errors Electron ptychography with high accuracy and precision Integrated constrained gradient descent protocol 10.1016/j.ultramic.2023.113716 Ultramicroscopy 248 113716- 2023-05-02T03:15:04Z 2023-05-02T03:15:04Z 2023-06-01 2023-05-01T15:41:57Z Article Ning, S, Xu, W, Loh, L, Lu, Z, Bosman, M, Zhang, F, He, Q (2023-06-01). An integrated constrained gradient descent (iCGD) protocol to correct scan-positional errors for electron ptychography with high accuracy and precision. Ultramicroscopy 248 : 113716-. ScholarBank@NUS Repository. https://doi.org/10.1016/j.ultramic.2023.113716 0304-3991 1879-2723 https://scholarbank.nus.edu.sg/handle/10635/239092 Elsevier BV Elements
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Correcting scan-positional errors Electron ptychography with high accuracy and precision Integrated constrained gradient descent protocol
spellingShingle	Correcting scan-positional errors Electron ptychography with high accuracy and precision Integrated constrained gradient descent protocol Ning, S Xu, W Loh, L Lu, Z Bosman, M Zhang, F He, Q An integrated constrained gradient descent (iCGD) protocol to correct scan-positional errors for electron ptychography with high accuracy and precision
description	10.1016/j.ultramic.2023.113716
author2	MATERIALS SCIENCE AND ENGINEERING
author_facet	MATERIALS SCIENCE AND ENGINEERING Ning, S Xu, W Loh, L Lu, Z Bosman, M Zhang, F He, Q
format	Article
author	Ning, S Xu, W Loh, L Lu, Z Bosman, M Zhang, F He, Q
author_sort	Ning, S
title	An integrated constrained gradient descent (iCGD) protocol to correct scan-positional errors for electron ptychography with high accuracy and precision
title_short	An integrated constrained gradient descent (iCGD) protocol to correct scan-positional errors for electron ptychography with high accuracy and precision
title_full	An integrated constrained gradient descent (iCGD) protocol to correct scan-positional errors for electron ptychography with high accuracy and precision
title_fullStr	An integrated constrained gradient descent (iCGD) protocol to correct scan-positional errors for electron ptychography with high accuracy and precision
title_full_unstemmed	An integrated constrained gradient descent (iCGD) protocol to correct scan-positional errors for electron ptychography with high accuracy and precision
title_sort	integrated constrained gradient descent (icgd) protocol to correct scan-positional errors for electron ptychography with high accuracy and precision
publisher	Elsevier BV
publishDate	2023
url	https://scholarbank.nus.edu.sg/handle/10635/239092
_version_	1800915816746582016

An integrated constrained gradient descent (iCGD) protocol to correct scan-positional errors for electron ptychography with high accuracy and precision

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