Growth and characterization of UHV sputtering HfO2film by plasma oxidation and low temperature annealing

10.1007/s10832-006-9909-x

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Main Authors: Li, Q., Ong, C.K., Wang, S.J., Wang, W.D., Chi, D.Z., Huan, A.C.H.
Other Authors: BIOCHEMISTRY
Format: Conference or Workshop Item
Published: 2011
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Online Access:http://scholarbank.nus.edu.sg/handle/10635/28959
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-289592023-10-26T10:13:01Z Growth and characterization of UHV sputtering HfO2film by plasma oxidation and low temperature annealing Li, Q. Ong, C.K. Wang, S.J. Wang, W.D. Chi, D.Z. Huan, A.C.H. BIOCHEMISTRY PHYSICS High-k dielectric thin films Metal-oxide-semiconductor Rapid thermal annealing UHV sputtering 10.1007/s10832-006-9909-x Journal of Electroceramics 16 4 517-521 JOELF 2011-11-29T06:11:28Z 2011-11-29T06:11:28Z 2006 Conference Paper Li, Q., Ong, C.K., Wang, S.J., Wang, W.D., Chi, D.Z., Huan, A.C.H. (2006). Growth and characterization of UHV sputtering HfO2film by plasma oxidation and low temperature annealing. Journal of Electroceramics 16 (4) : 517-521. ScholarBank@NUS Repository. https://doi.org/10.1007/s10832-006-9909-x 13853449 15738663 http://scholarbank.nus.edu.sg/handle/10635/28959 000241750700050 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic High-k dielectric thin films
Metal-oxide-semiconductor
Rapid thermal annealing
UHV sputtering
spellingShingle High-k dielectric thin films
Metal-oxide-semiconductor
Rapid thermal annealing
UHV sputtering
Li, Q.
Ong, C.K.
Wang, S.J.
Wang, W.D.
Chi, D.Z.
Huan, A.C.H.
Growth and characterization of UHV sputtering HfO2film by plasma oxidation and low temperature annealing
description 10.1007/s10832-006-9909-x
author2 BIOCHEMISTRY
author_facet BIOCHEMISTRY
Li, Q.
Ong, C.K.
Wang, S.J.
Wang, W.D.
Chi, D.Z.
Huan, A.C.H.
format Conference or Workshop Item
author Li, Q.
Ong, C.K.
Wang, S.J.
Wang, W.D.
Chi, D.Z.
Huan, A.C.H.
author_sort Li, Q.
title Growth and characterization of UHV sputtering HfO2film by plasma oxidation and low temperature annealing
title_short Growth and characterization of UHV sputtering HfO2film by plasma oxidation and low temperature annealing
title_full Growth and characterization of UHV sputtering HfO2film by plasma oxidation and low temperature annealing
title_fullStr Growth and characterization of UHV sputtering HfO2film by plasma oxidation and low temperature annealing
title_full_unstemmed Growth and characterization of UHV sputtering HfO2film by plasma oxidation and low temperature annealing
title_sort growth and characterization of uhv sputtering hfo2film by plasma oxidation and low temperature annealing
publishDate 2011
url http://scholarbank.nus.edu.sg/handle/10635/28959
_version_ 1781410678662234112