Electromigration-induced failure characteristics of GMR spin- valves and magnetic multilayers for the electrical reliability of spintronic devices
Ph.D
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2011
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sg-nus-scholar.10635-299642017-10-21T08:02:49Z Electromigration-induced failure characteristics of GMR spin- valves and magnetic multilayers for the electrical reliability of spintronic devices JIANG JING ELECTRICAL & COMPUTER ENGINEERING BAE SEONGTAE GMR Spin-valve,electromigration,Cu inter-diffusion,electrical and magnetic stability,Co and CoFe diffusion barrier,Hall effect-induce Lorentz force Ph.D DOCTOR OF PHILOSOPHY 2011-12-31T18:01:42Z 2011-12-31T18:01:42Z 2011-01-27 Thesis JIANG JING (2011-01-27). Electromigration-induced failure characteristics of GMR spin- valves and magnetic multilayers for the electrical reliability of spintronic devices. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/29964 NOT_IN_WOS en |
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English |
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GMR Spin-valve,electromigration,Cu inter-diffusion,electrical and magnetic stability,Co and CoFe diffusion barrier,Hall effect-induce Lorentz force |
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GMR Spin-valve,electromigration,Cu inter-diffusion,electrical and magnetic stability,Co and CoFe diffusion barrier,Hall effect-induce Lorentz force JIANG JING Electromigration-induced failure characteristics of GMR spin- valves and magnetic multilayers for the electrical reliability of spintronic devices |
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Ph.D |
author2 |
ELECTRICAL & COMPUTER ENGINEERING |
author_facet |
ELECTRICAL & COMPUTER ENGINEERING JIANG JING |
format |
Theses and Dissertations |
author |
JIANG JING |
author_sort |
JIANG JING |
title |
Electromigration-induced failure characteristics of GMR spin- valves and magnetic multilayers for the electrical reliability of spintronic devices |
title_short |
Electromigration-induced failure characteristics of GMR spin- valves and magnetic multilayers for the electrical reliability of spintronic devices |
title_full |
Electromigration-induced failure characteristics of GMR spin- valves and magnetic multilayers for the electrical reliability of spintronic devices |
title_fullStr |
Electromigration-induced failure characteristics of GMR spin- valves and magnetic multilayers for the electrical reliability of spintronic devices |
title_full_unstemmed |
Electromigration-induced failure characteristics of GMR spin- valves and magnetic multilayers for the electrical reliability of spintronic devices |
title_sort |
electromigration-induced failure characteristics of gmr spin- valves and magnetic multilayers for the electrical reliability of spintronic devices |
publishDate |
2011 |
url |
http://scholarbank.nus.edu.sg/handle/10635/29964 |
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1681080911582461952 |