Electromigration-induced failure characteristics of GMR spin- valves and magnetic multilayers for the electrical reliability of spintronic devices

Ph.D

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Main Author: JIANG JING
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Theses and Dissertations
Language:English
Published: 2011
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/29964
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Institution: National University of Singapore
Language: English
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spelling sg-nus-scholar.10635-299642017-10-21T08:02:49Z Electromigration-induced failure characteristics of GMR spin- valves and magnetic multilayers for the electrical reliability of spintronic devices JIANG JING ELECTRICAL & COMPUTER ENGINEERING BAE SEONGTAE GMR Spin-valve,electromigration,Cu inter-diffusion,electrical and magnetic stability,Co and CoFe diffusion barrier,Hall effect-induce Lorentz force Ph.D DOCTOR OF PHILOSOPHY 2011-12-31T18:01:42Z 2011-12-31T18:01:42Z 2011-01-27 Thesis JIANG JING (2011-01-27). Electromigration-induced failure characteristics of GMR spin- valves and magnetic multilayers for the electrical reliability of spintronic devices. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/29964 NOT_IN_WOS en
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
language English
topic GMR Spin-valve,electromigration,Cu inter-diffusion,electrical and magnetic stability,Co and CoFe diffusion barrier,Hall effect-induce Lorentz force
spellingShingle GMR Spin-valve,electromigration,Cu inter-diffusion,electrical and magnetic stability,Co and CoFe diffusion barrier,Hall effect-induce Lorentz force
JIANG JING
Electromigration-induced failure characteristics of GMR spin- valves and magnetic multilayers for the electrical reliability of spintronic devices
description Ph.D
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
JIANG JING
format Theses and Dissertations
author JIANG JING
author_sort JIANG JING
title Electromigration-induced failure characteristics of GMR spin- valves and magnetic multilayers for the electrical reliability of spintronic devices
title_short Electromigration-induced failure characteristics of GMR spin- valves and magnetic multilayers for the electrical reliability of spintronic devices
title_full Electromigration-induced failure characteristics of GMR spin- valves and magnetic multilayers for the electrical reliability of spintronic devices
title_fullStr Electromigration-induced failure characteristics of GMR spin- valves and magnetic multilayers for the electrical reliability of spintronic devices
title_full_unstemmed Electromigration-induced failure characteristics of GMR spin- valves and magnetic multilayers for the electrical reliability of spintronic devices
title_sort electromigration-induced failure characteristics of gmr spin- valves and magnetic multilayers for the electrical reliability of spintronic devices
publishDate 2011
url http://scholarbank.nus.edu.sg/handle/10635/29964
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