Electromigration-induced failure characteristics of GMR spin- valves and magnetic multilayers for the electrical reliability of spintronic devices

• Main Author: JIANG JING
• Other Authors: ELECTRICAL & COMPUTER ENGINEERING
• Format: Theses and Dissertations
• Language: English
• Published: 2011
• Subjects: GMR Spin-valve,electromigration,Cu inter-diffusion,electrical and magnetic stability,Co and CoFe diffusion barrier,Hall effect-induce Lorentz force
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/29964
• Institution: National University of Singapore

Ph.D