Method and apparatus for measuring quantitative voltage contrast

US5486769

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Bibliographic Details
Main Authors: CHIM, WAI K., PHANG, JACOB C. H., CHAN, DANIEL S. H.
Other Authors: ELECTRICAL ENGINEERING
Format: Patent
Published: 2012
Online Access:http://scholarbank.nus.edu.sg/handle/10635/32540
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Institution: National University of Singapore
id sg-nus-scholar.10635-32540
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spelling sg-nus-scholar.10635-325402015-07-29T07:03:37Z Method and apparatus for measuring quantitative voltage contrast CHIM, WAI K. PHANG, JACOB C. H. CHAN, DANIEL S. H. ELECTRICAL ENGINEERING NATIONAL UNIVERSITY OF SINGAPORE US5486769 Granted Patent 2012-05-02T02:26:44Z 2012-05-02T02:26:44Z 1996-01-23 Patent CHIM, WAI K.,PHANG, JACOB C. H.,CHAN, DANIEL S. H. (1996-01-23). Method and apparatus for measuring quantitative voltage contrast. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/32540 NOT_IN_WOS PatSnap
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description US5486769
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
CHIM, WAI K.
PHANG, JACOB C. H.
CHAN, DANIEL S. H.
format Patent
author CHIM, WAI K.
PHANG, JACOB C. H.
CHAN, DANIEL S. H.
spellingShingle CHIM, WAI K.
PHANG, JACOB C. H.
CHAN, DANIEL S. H.
Method and apparatus for measuring quantitative voltage contrast
author_sort CHIM, WAI K.
title Method and apparatus for measuring quantitative voltage contrast
title_short Method and apparatus for measuring quantitative voltage contrast
title_full Method and apparatus for measuring quantitative voltage contrast
title_fullStr Method and apparatus for measuring quantitative voltage contrast
title_full_unstemmed Method and apparatus for measuring quantitative voltage contrast
title_sort method and apparatus for measuring quantitative voltage contrast
publishDate 2012
url http://scholarbank.nus.edu.sg/handle/10635/32540
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