Selective deposition of a particle beam based on charging characteristics of a sample
US6608305
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2012
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sg-nus-scholar.10635-326442015-07-29T07:03:48Z Selective deposition of a particle beam based on charging characteristics of a sample KIN, WONG WAI PHANG, JACOB C. H. THONG, JOHN ELECTRICAL & COMPUTER ENGINEERING NATIONAL UNIVERSITY OF SINGAPORE US6608305 Granted Patent 2012-05-02T02:28:15Z 2012-05-02T02:28:15Z 2003-08-19 Patent KIN, WONG WAI,PHANG, JACOB C. H.,THONG, JOHN (2003-08-19). Selective deposition of a particle beam based on charging characteristics of a sample. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/32644 NOT_IN_WOS PatSnap |
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US6608305 |
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ELECTRICAL & COMPUTER ENGINEERING |
author_facet |
ELECTRICAL & COMPUTER ENGINEERING KIN, WONG WAI PHANG, JACOB C. H. THONG, JOHN |
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Patent |
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KIN, WONG WAI PHANG, JACOB C. H. THONG, JOHN |
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KIN, WONG WAI PHANG, JACOB C. H. THONG, JOHN Selective deposition of a particle beam based on charging characteristics of a sample |
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KIN, WONG WAI |
title |
Selective deposition of a particle beam based on charging characteristics of a sample |
title_short |
Selective deposition of a particle beam based on charging characteristics of a sample |
title_full |
Selective deposition of a particle beam based on charging characteristics of a sample |
title_fullStr |
Selective deposition of a particle beam based on charging characteristics of a sample |
title_full_unstemmed |
Selective deposition of a particle beam based on charging characteristics of a sample |
title_sort |
selective deposition of a particle beam based on charging characteristics of a sample |
publishDate |
2012 |
url |
http://scholarbank.nus.edu.sg/handle/10635/32644 |
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1681081260921847808 |