Highly selective and complete interconnect metal line and via/contact hole filling by electroless plating

US6660636

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Bibliographic Details
Main Authors: LI, SAM FONG YAU, NG, HOU TEE
Other Authors: CHEMISTRY
Format: Patent
Published: 2012
Online Access:http://scholarbank.nus.edu.sg/handle/10635/32659
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Institution: National University of Singapore
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