Multi-beam ion/electron spectra-microscope

US20090321634A1

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Bibliographic Details
Main Author: KHURSHEED ANJAM
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Patent
Published: 2012
Online Access:http://scholarbank.nus.edu.sg/handle/10635/34944
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Institution: National University of Singapore
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Summary:US20090321634A1