Multi-beam ion/electron spectra-microscope

US20090321634A1

Saved in:

Bibliographic Details
Main Author:	KHURSHEED ANJAM
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Patent
Published:	2012
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/34944
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore

id	sg-nus-scholar.10635-34944
record_format	dspace
spelling	sg-nus-scholar.10635-349442015-07-29T07:20:09Z Multi-beam ion/electron spectra-microscope KHURSHEED ANJAM ELECTRICAL & COMPUTER ENGINEERING NATIONAL UNIVERSITY OF SINGAPORE US20090321634A1 Published Application 2012-10-08T08:23:08Z 2012-10-08T08:23:08Z 2009-12-31 Patent KHURSHEED ANJAM (2009-12-31). Multi-beam ion/electron spectra-microscope. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/34944 NOT_IN_WOS PatSnap
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	US20090321634A1
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING KHURSHEED ANJAM
format	Patent
author	KHURSHEED ANJAM
spellingShingle	KHURSHEED ANJAM Multi-beam ion/electron spectra-microscope
author_sort	KHURSHEED ANJAM
title	Multi-beam ion/electron spectra-microscope
title_short	Multi-beam ion/electron spectra-microscope
title_full	Multi-beam ion/electron spectra-microscope
title_fullStr	Multi-beam ion/electron spectra-microscope
title_full_unstemmed	Multi-beam ion/electron spectra-microscope
title_sort	multi-beam ion/electron spectra-microscope
publishDate	2012
url	http://scholarbank.nus.edu.sg/handle/10635/34944
_version_	1681081561629327360

Similar Items