An application of spectroscopic emission microscopy and cathodoluminescence to the failure analysis of near-infrared light emitting diodes

An application of spectroscopic emission microscopy and cathodoluminescence to the failure analysis of near-infrared light emitting diodes

Microelectronics Reliability

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Main Authors: Pey, K.L., Chim, W.K., Koh, L.S., Liu, Y.Y., Chew, S.Y.C.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/50529
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Institution: National University of Singapore
id sg-nus-scholar.10635-50529
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spelling sg-nus-scholar.10635-505292015-02-02T15:00:49Z An application of spectroscopic emission microscopy and cathodoluminescence to the failure analysis of near-infrared light emitting diodes Pey, K.L. Chim, W.K. Koh, L.S. Liu, Y.Y. Chew, S.Y.C. ELECTRICAL ENGINEERING INSTITUTE OF MICROELECTRONICS Microelectronics Reliability 35 6 935-946 MCRLA 2014-04-23T02:58:50Z 2014-04-23T02:58:50Z 1995-06 Article Pey, K.L.,Chim, W.K.,Koh, L.S.,Liu, Y.Y.,Chew, S.Y.C. (1995-06). An application of spectroscopic emission microscopy and cathodoluminescence to the failure analysis of near-infrared light emitting diodes. Microelectronics Reliability 35 (6) : 935-946. ScholarBank@NUS Repository. 00262714 http://scholarbank.nus.edu.sg/handle/10635/50529 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description Microelectronics Reliability
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Pey, K.L.
Chim, W.K.
Koh, L.S.
Liu, Y.Y.
Chew, S.Y.C.
format Article
author Pey, K.L.
Chim, W.K.
Koh, L.S.
Liu, Y.Y.
Chew, S.Y.C.
spellingShingle Pey, K.L.
Chim, W.K.
Koh, L.S.
Liu, Y.Y.
Chew, S.Y.C.
An application of spectroscopic emission microscopy and cathodoluminescence to the failure analysis of near-infrared light emitting diodes
author_sort Pey, K.L.
title An application of spectroscopic emission microscopy and cathodoluminescence to the failure analysis of near-infrared light emitting diodes
title_short An application of spectroscopic emission microscopy and cathodoluminescence to the failure analysis of near-infrared light emitting diodes
title_full An application of spectroscopic emission microscopy and cathodoluminescence to the failure analysis of near-infrared light emitting diodes
title_fullStr An application of spectroscopic emission microscopy and cathodoluminescence to the failure analysis of near-infrared light emitting diodes
title_full_unstemmed An application of spectroscopic emission microscopy and cathodoluminescence to the failure analysis of near-infrared light emitting diodes
title_sort application of spectroscopic emission microscopy and cathodoluminescence to the failure analysis of near-infrared light emitting diodes
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/50529
_version_ 1681083685708759040

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