An application of spectroscopic emission microscopy and cathodoluminescence to the failure analysis of near-infrared light emitting diodes

• Main Authors: Pey, K.L., Chim, W.K., Koh, L.S., Liu, Y.Y., Chew, S.Y.C.
• Other Authors: ELECTRICAL ENGINEERING
• Format: Article
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/50529
• Institution: National University of Singapore

Microelectronics Reliability