Extraction of bias-dependent source and gate resistance from measured S-parameters under all bias conditions

Journal of Electromagnetic Waves and Applications

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Main Authors:	Lin, F., Cao, J., Kooi, P.S., Leong, M.S.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/50560
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-505602015-01-08T16:31:18Z Extraction of bias-dependent source and gate resistance from measured S-parameters under all bias conditions Lin, F. Cao, J. Kooi, P.S. Leong, M.S. ELECTRICAL ENGINEERING INSTITUTE OF MICROELECTRONICS Journal of Electromagnetic Waves and Applications 11 8 1103-1119 JEWAE 2014-04-23T02:59:41Z 2014-04-23T02:59:41Z 1997 Article Lin, F.,Cao, J.,Kooi, P.S.,Leong, M.S. (1997). Extraction of bias-dependent source and gate resistance from measured S-parameters under all bias conditions. Journal of Electromagnetic Waves and Applications 11 (8) : 1103-1119. ScholarBank@NUS Repository. 09205071 http://scholarbank.nus.edu.sg/handle/10635/50560 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Journal of Electromagnetic Waves and Applications
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Lin, F. Cao, J. Kooi, P.S. Leong, M.S.
format	Article
author	Lin, F. Cao, J. Kooi, P.S. Leong, M.S.
spellingShingle	Lin, F. Cao, J. Kooi, P.S. Leong, M.S. Extraction of bias-dependent source and gate resistance from measured S-parameters under all bias conditions
author_sort	Lin, F.
title	Extraction of bias-dependent source and gate resistance from measured S-parameters under all bias conditions
title_short	Extraction of bias-dependent source and gate resistance from measured S-parameters under all bias conditions
title_full	Extraction of bias-dependent source and gate resistance from measured S-parameters under all bias conditions
title_fullStr	Extraction of bias-dependent source and gate resistance from measured S-parameters under all bias conditions
title_full_unstemmed	Extraction of bias-dependent source and gate resistance from measured S-parameters under all bias conditions
title_sort	extraction of bias-dependent source and gate resistance from measured s-parameters under all bias conditions
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/50560
_version_	1681083691150868480

Extraction of bias-dependent source and gate resistance from measured S-parameters under all bias conditions

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