Extraction of bias-dependent source and gate resistance from measured S-parameters under all bias conditions

Extraction of bias-dependent source and gate resistance from measured S-parameters under all bias conditions

Journal of Electromagnetic Waves and Applications

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Bibliographic Details
Main Authors: Lin, F., Cao, J., Kooi, P.S., Leong, M.S.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/50560
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Institution: National University of Singapore
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