Fluence dependence of IBIC collection efficiency of CMOS transistors

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

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Main Authors: Osipowicz, T., Sanchez, J.L., Orlic, I., Watt, F., Kolachina, S., Chan, D.S.H., Phang, J.C.H.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
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Online Access:http://scholarbank.nus.edu.sg/handle/10635/50562
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spelling sg-nus-scholar.10635-505622024-11-14T01:01:42Z Fluence dependence of IBIC collection efficiency of CMOS transistors Osipowicz, T. Sanchez, J.L. Orlic, I. Watt, F. Kolachina, S. Chan, D.S.H. Phang, J.C.H. ELECTRICAL ENGINEERING PHYSICS Charge microscopy Device imaging Microbeam Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 136-138 1345-1348 NIMBE 2014-04-23T02:59:44Z 2014-04-23T02:59:44Z 1998-03 Article Osipowicz, T.,Sanchez, J.L.,Orlic, I.,Watt, F.,Kolachina, S.,Chan, D.S.H.,Phang, J.C.H. (1998-03). Fluence dependence of IBIC collection efficiency of CMOS transistors. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 136-138 : 1345-1348. ScholarBank@NUS Repository. 0168583X http://scholarbank.nus.edu.sg/handle/10635/50562 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic Charge microscopy
Device imaging
Microbeam
spellingShingle Charge microscopy
Device imaging
Microbeam
Osipowicz, T.
Sanchez, J.L.
Orlic, I.
Watt, F.
Kolachina, S.
Chan, D.S.H.
Phang, J.C.H.
Fluence dependence of IBIC collection efficiency of CMOS transistors
description Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
author2 ELECTRICAL ENGINEERING
author_facet ELECTRICAL ENGINEERING
Osipowicz, T.
Sanchez, J.L.
Orlic, I.
Watt, F.
Kolachina, S.
Chan, D.S.H.
Phang, J.C.H.
format Article
author Osipowicz, T.
Sanchez, J.L.
Orlic, I.
Watt, F.
Kolachina, S.
Chan, D.S.H.
Phang, J.C.H.
author_sort Osipowicz, T.
title Fluence dependence of IBIC collection efficiency of CMOS transistors
title_short Fluence dependence of IBIC collection efficiency of CMOS transistors
title_full Fluence dependence of IBIC collection efficiency of CMOS transistors
title_fullStr Fluence dependence of IBIC collection efficiency of CMOS transistors
title_full_unstemmed Fluence dependence of IBIC collection efficiency of CMOS transistors
title_sort fluence dependence of ibic collection efficiency of cmos transistors
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/50562
_version_ 1821213754430324736