Fluence dependence of IBIC collection efficiency of CMOS transistors

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

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Bibliographic Details
Main Authors: Osipowicz, T., Sanchez, J.L., Orlic, I., Watt, F., Kolachina, S., Chan, D.S.H., Phang, J.C.H.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
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Online Access:http://scholarbank.nus.edu.sg/handle/10635/50562
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Institution: National University of Singapore

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