Microcracks of the thin-film head alumina: "l" cracks and "u" cracks

Microcracks of the thin-film head alumina: "l" cracks and "u" cracks

IEEE Transactions on Magnetics

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Bibliographic Details
Main Authors: Chekanov, A.S., Low, T.S., Alli, S., Kolosov, O., Briggs, A.
Other Authors: DATA STORAGE INSTITUTE
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/50577
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Institution: National University of Singapore
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Summary:IEEE Transactions on Magnetics

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