Microcracks of the thin-film head alumina: "l" cracks and "u" cracks

• Main Authors: Chekanov, A.S., Low, T.S., Alli, S., Kolosov, O., Briggs, A.
• Other Authors: DATA STORAGE INSTITUTE
• Format: Article
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/50577
• Institution: National University of Singapore

IEEE Transactions on Magnetics