Yield optimization by design centering & worst-case distance analysis
Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors
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sg-nus-scholar.10635-506112015-01-08T14:23:56Z Yield optimization by design centering & worst-case distance analysis Samudra, G.S. Chen, H.M. Chan, D.S.H. Ibrahim, Yaacob ELECTRICAL ENGINEERING INDUSTRIAL & SYSTEMS ENGINEERING Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors 289-290 PIIPE 2014-04-23T03:01:16Z 2014-04-23T03:01:16Z 1999 Article Samudra, G.S.,Chen, H.M.,Chan, D.S.H.,Ibrahim, Yaacob (1999). Yield optimization by design centering & worst-case distance analysis. Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors : 289-290. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/50611 NOT_IN_WOS Scopus |
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Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors |
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ELECTRICAL ENGINEERING |
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ELECTRICAL ENGINEERING Samudra, G.S. Chen, H.M. Chan, D.S.H. Ibrahim, Yaacob |
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Samudra, G.S. Chen, H.M. Chan, D.S.H. Ibrahim, Yaacob |
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Samudra, G.S. Chen, H.M. Chan, D.S.H. Ibrahim, Yaacob Yield optimization by design centering & worst-case distance analysis |
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Samudra, G.S. |
title |
Yield optimization by design centering & worst-case distance analysis |
title_short |
Yield optimization by design centering & worst-case distance analysis |
title_full |
Yield optimization by design centering & worst-case distance analysis |
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Yield optimization by design centering & worst-case distance analysis |
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Yield optimization by design centering & worst-case distance analysis |
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yield optimization by design centering & worst-case distance analysis |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/50611 |
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