Improved technique for measuring complex scattering coefficients of two-port microwave devices using only six power detectors

Conference Record - IEEE Instrumentation and Measurement Technology Conference

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Main Authors:	Yeo, S.P., Ang, C.K., Cheng, M.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/50628
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-50628
record_format	dspace
spelling	sg-nus-scholar.10635-506282024-11-13T18:13:51Z Improved technique for measuring complex scattering coefficients of two-port microwave devices using only six power detectors Yeo, S.P. Ang, C.K. Cheng, M. ELECTRICAL ENGINEERING CENTRE FOR COMPUTATIONAL MECHANICS Conference Record - IEEE Instrumentation and Measurement Technology Conference 1 638-641 CRIIE 2014-04-23T03:01:46Z 2014-04-23T03:01:46Z 1998 Conference Paper Yeo, S.P.,Ang, C.K.,Cheng, M. (1998). Improved technique for measuring complex scattering coefficients of two-port microwave devices using only six power detectors. Conference Record - IEEE Instrumentation and Measurement Technology Conference 1 : 638-641. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/50628 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	Conference Record - IEEE Instrumentation and Measurement Technology Conference
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Yeo, S.P. Ang, C.K. Cheng, M.
format	Conference or Workshop Item
author	Yeo, S.P. Ang, C.K. Cheng, M.
spellingShingle	Yeo, S.P. Ang, C.K. Cheng, M. Improved technique for measuring complex scattering coefficients of two-port microwave devices using only six power detectors
author_sort	Yeo, S.P.
title	Improved technique for measuring complex scattering coefficients of two-port microwave devices using only six power detectors
title_short	Improved technique for measuring complex scattering coefficients of two-port microwave devices using only six power detectors
title_full	Improved technique for measuring complex scattering coefficients of two-port microwave devices using only six power detectors
title_fullStr	Improved technique for measuring complex scattering coefficients of two-port microwave devices using only six power detectors
title_full_unstemmed	Improved technique for measuring complex scattering coefficients of two-port microwave devices using only six power detectors
title_sort	improved technique for measuring complex scattering coefficients of two-port microwave devices using only six power detectors
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/50628
_version_	1821191415810490368

Improved technique for measuring complex scattering coefficients of two-port microwave devices using only six power detectors

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