A neural network approach to determining optimal inspection sampling size for CMM

A neural network approach to determining optimal inspection sampling size for CMM

Computer Integrated Manufacturing Systems

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Bibliographic Details
Main Authors: Zhang, Y.F., Nee, A.Y.C., Fuh, J.Y.H., Neo, K.S., Loy, H.K.
Other Authors: MECHANICAL & PRODUCTION ENGINEERING
Format: Article
Published: 2014
Subjects:
Back-propagation neural networks
CMM
Sampling size
Tolerance band
Online Access:http://scholarbank.nus.edu.sg/handle/10635/54478
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Institution: National University of Singapore
Description
Summary:Computer Integrated Manufacturing Systems

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