A neural network approach to determining optimal inspection sampling size for CMM

• Main Authors: Zhang, Y.F., Nee, A.Y.C., Fuh, J.Y.H., Neo, K.S., Loy, H.K.
• 其他作者: MECHANICAL & PRODUCTION ENGINEERING
• 格式: Article
• 出版: 2014
• 主題: Back-propagation neural networks; CMM; Sampling size; Tolerance band
• 在線閱讀: http://scholarbank.nus.edu.sg/handle/10635/54478

Computer Integrated Manufacturing Systems