A neural network approach to determining optimal inspection sampling size for CMM

Computer Integrated Manufacturing Systems

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Bibliographic Details
Main Authors:	Zhang, Y.F., Nee, A.Y.C., Fuh, J.Y.H., Neo, K.S., Loy, H.K.
Other Authors:	MECHANICAL & PRODUCTION ENGINEERING
Format:	Article
Published:	2014
Subjects:	Back-propagation neural networks CMM Sampling size Tolerance band
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/54478
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-54478
record_format	dspace
spelling	sg-nus-scholar.10635-544782015-01-08T06:46:07Z A neural network approach to determining optimal inspection sampling size for CMM Zhang, Y.F. Nee, A.Y.C. Fuh, J.Y.H. Neo, K.S. Loy, H.K. MECHANICAL & PRODUCTION ENGINEERING Back-propagation neural networks CMM Sampling size Tolerance band Computer Integrated Manufacturing Systems 9 3 161-169 CMASE 2014-06-16T09:31:34Z 2014-06-16T09:31:34Z 1996 Article Zhang, Y.F.,Nee, A.Y.C.,Fuh, J.Y.H.,Neo, K.S.,Loy, H.K. (1996). A neural network approach to determining optimal inspection sampling size for CMM. Computer Integrated Manufacturing Systems 9 (3) : 161-169. ScholarBank@NUS Repository. 09515240 http://scholarbank.nus.edu.sg/handle/10635/54478 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
topic	Back-propagation neural networks CMM Sampling size Tolerance band
spellingShingle	Back-propagation neural networks CMM Sampling size Tolerance band Zhang, Y.F. Nee, A.Y.C. Fuh, J.Y.H. Neo, K.S. Loy, H.K. A neural network approach to determining optimal inspection sampling size for CMM
description	Computer Integrated Manufacturing Systems
author2	MECHANICAL & PRODUCTION ENGINEERING
author_facet	MECHANICAL & PRODUCTION ENGINEERING Zhang, Y.F. Nee, A.Y.C. Fuh, J.Y.H. Neo, K.S. Loy, H.K.
format	Article
author	Zhang, Y.F. Nee, A.Y.C. Fuh, J.Y.H. Neo, K.S. Loy, H.K.
author_sort	Zhang, Y.F.
title	A neural network approach to determining optimal inspection sampling size for CMM
title_short	A neural network approach to determining optimal inspection sampling size for CMM
title_full	A neural network approach to determining optimal inspection sampling size for CMM
title_fullStr	A neural network approach to determining optimal inspection sampling size for CMM
title_full_unstemmed	A neural network approach to determining optimal inspection sampling size for CMM
title_sort	neural network approach to determining optimal inspection sampling size for cmm
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/54478
_version_	1681084321653325824

A neural network approach to determining optimal inspection sampling size for CMM

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