A neural-network-based local-field-effect correction scheme for quantitative voltage contrast measurements in the scanning electron microscope

A neural-network-based local-field-effect correction scheme for quantitative voltage contrast measurements in the scanning electron microscope

10.1088/0957-0233/7/6/004

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Bibliographic Details
Main Author: Chim, W.K.
Other Authors: ELECTRICAL ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/54480
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Institution: National University of Singapore
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Summary:10.1088/0957-0233/7/6/004

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