A neural-network-based local-field-effect correction scheme for quantitative voltage contrast measurements in the scanning electron microscope

10.1088/0957-0233/7/6/004

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Bibliographic Details
Main Author:	Chim, W.K.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/54480
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Institution:	National University of Singapore

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spelling	sg-nus-scholar.10635-544802023-10-29T21:39:30Z A neural-network-based local-field-effect correction scheme for quantitative voltage contrast measurements in the scanning electron microscope Chim, W.K. ELECTRICAL ENGINEERING 10.1088/0957-0233/7/6/004 Measurement Science and Technology 7 6 882-887 MSTCE 2014-06-16T09:31:35Z 2014-06-16T09:31:35Z 1996-06 Article Chim, W.K. (1996-06). A neural-network-based local-field-effect correction scheme for quantitative voltage contrast measurements in the scanning electron microscope. Measurement Science and Technology 7 (6) : 882-887. ScholarBank@NUS Repository. https://doi.org/10.1088/0957-0233/7/6/004 09570233 http://scholarbank.nus.edu.sg/handle/10635/54480 A1996UR36000004 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1088/0957-0233/7/6/004
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Chim, W.K.
format	Article
author	Chim, W.K.
spellingShingle	Chim, W.K. A neural-network-based local-field-effect correction scheme for quantitative voltage contrast measurements in the scanning electron microscope
author_sort	Chim, W.K.
title	A neural-network-based local-field-effect correction scheme for quantitative voltage contrast measurements in the scanning electron microscope
title_short	A neural-network-based local-field-effect correction scheme for quantitative voltage contrast measurements in the scanning electron microscope
title_full	A neural-network-based local-field-effect correction scheme for quantitative voltage contrast measurements in the scanning electron microscope
title_fullStr	A neural-network-based local-field-effect correction scheme for quantitative voltage contrast measurements in the scanning electron microscope
title_full_unstemmed	A neural-network-based local-field-effect correction scheme for quantitative voltage contrast measurements in the scanning electron microscope
title_sort	neural-network-based local-field-effect correction scheme for quantitative voltage contrast measurements in the scanning electron microscope
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/54480
_version_	1781411987312345088

A neural-network-based local-field-effect correction scheme for quantitative voltage contrast measurements in the scanning electron microscope

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