An air-flow based wafer bake system for improved temperature uniformity

10.1016/j.jprocont.2008.04.021

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Bibliographic Details
Main Authors: Wang, L., Loh, A.P., Gong, Z.M., Chow, S.L.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
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Online Access:http://scholarbank.nus.edu.sg/handle/10635/54986
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-549862024-11-11T13:23:33Z An air-flow based wafer bake system for improved temperature uniformity Wang, L. Loh, A.P. Gong, Z.M. Chow, S.L. ELECTRICAL & COMPUTER ENGINEERING Microlithography Post exposure bake (PEB) Temperature uniformity Wafer-baking process 10.1016/j.jprocont.2008.04.021 Journal of Process Control 18 10 931-936 JPCOE 2014-06-17T02:37:50Z 2014-06-17T02:37:50Z 2008-12 Article Wang, L., Loh, A.P., Gong, Z.M., Chow, S.L. (2008-12). An air-flow based wafer bake system for improved temperature uniformity. Journal of Process Control 18 (10) : 931-936. ScholarBank@NUS Repository. https://doi.org/10.1016/j.jprocont.2008.04.021 09591524 http://scholarbank.nus.edu.sg/handle/10635/54986 000261897200004 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic Microlithography
Post exposure bake (PEB)
Temperature uniformity
Wafer-baking process
spellingShingle Microlithography
Post exposure bake (PEB)
Temperature uniformity
Wafer-baking process
Wang, L.
Loh, A.P.
Gong, Z.M.
Chow, S.L.
An air-flow based wafer bake system for improved temperature uniformity
description 10.1016/j.jprocont.2008.04.021
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Wang, L.
Loh, A.P.
Gong, Z.M.
Chow, S.L.
format Article
author Wang, L.
Loh, A.P.
Gong, Z.M.
Chow, S.L.
author_sort Wang, L.
title An air-flow based wafer bake system for improved temperature uniformity
title_short An air-flow based wafer bake system for improved temperature uniformity
title_full An air-flow based wafer bake system for improved temperature uniformity
title_fullStr An air-flow based wafer bake system for improved temperature uniformity
title_full_unstemmed An air-flow based wafer bake system for improved temperature uniformity
title_sort air-flow based wafer bake system for improved temperature uniformity
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/54986
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