Anomalous Hall effect measurements on capped bit-patterned media

10.1063/1.3645634

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Bibliographic Details
Main Authors:	Ranjbar, M., Piramanayagam, S.N., Wong, S.K., Sbiaa, R., Chong, T.C.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/55122
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Institution:	National University of Singapore

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Summary:	10.1063/1.3645634

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