Anomalous Hall effect measurements on capped bit-patterned media
10.1063/1.3645634
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Main Authors: | Ranjbar, M., Piramanayagam, S.N., Wong, S.K., Sbiaa, R., Chong, T.C. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/55122 |
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Institution: | National University of Singapore |
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