Correlation of structural and magnetic properties of ferromagnetic Mn-implanted Si1-x Gex films

10.1063/1.2842404

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Bibliographic Details
Main Authors:	Ko, V., Teo, K.L., Liew, T., Chong, T.C., Liu, T., Wee, A.T.S., Du, A.Y., Stoffel, M., Schmidt, O.G.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/55457
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Institution:	National University of Singapore

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Summary:	10.1063/1.2842404

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